En Yun-fei,: шукати на сайті Z-Library

Найбільша колекція наукових статей у сіті. 70,000,000+ безкоштовних статей.

Пожертвування 15 вересня 2024 – 1 жовтня 2024

Z-Library - одна з найбільших онлайн-бібліотек у світі, в якій зберігається більше 17,000,000 книг та 84,837,000 статей. Ми намагаємось зробити літературу доступною кожному. Сьогодні (15 вересня 2024) ми відкриваємо додатковий збір пожертвувань на підтримку та розвиток проекту.

Також БЕЗЛІМТНІ завантаження (протягом 31 дня після завершення пожертвування) доступні для ВСІХ користувачів, які підтримають проект в період збору коштів до 1 жовтня 2024.

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Статті (56)
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Interhemispheric functional connectivity for Alzheimer’s disease and amnestic mild cognitive impairment based on the triple network model; 基于三网络模式的阿尔茨海默病和遗忘型轻度认知功能障碍的半球间功能连接研究;

Liao, Zheng-luan, Tan, Yun-fei, Qiu, Ya-ju, Zhu, Jun-peng, Chen, Yan, Lin, Si-si, Wu, Ming-hao, Mao, Yan-ping, Hu, Jiao-jiao, Ding, Zhong-xiang, Yu, En-yan

Журнал:

Journal of Zhejiang University SCIENCE B

Рік:

2018

Мова:

english

Файл:

PDF, 1.25 MB

english, 2018

Thermo-mechanical fatigue reliability optimization of PBGA solder joints based on ANN-PSO

Ji-cheng Zhou, Xiao-qing Xiao, Yun-fei En, Ni Chen, Xiang-zhong Wang

Журнал:

Journal of Central South University

Рік:

2008

Мова:

english

Файл:

PDF, 301 KB

english, 2008

[IEEE 2013 20th IEEE International Symposium on the Physical and Failure Analysis of Integrated Circuits (IPFA) - Suzhou, China (2013.07.15-2013.07.19)] Proceedings of the 20th IEEE International Symposium on the Physical and Failure Analysis of Integrated Circuits (IPFA) - Development and application of prognostics and health management technology

Xie Shao-feng,, En Yun-fei,, Lin Xiao-ling,, Lu Yu-dong,, Chen Yi-qiang,

Рік:

2013

Мова:

english

Файл:

PDF, 703 KB

english, 2013

[IEEE 2013 International Conference on Quality, Reliability, Risk, Maintenance, and Safety Engineering (QR2MSE) - Chengdu, China (2013.07.15-2013.07.18)] 2013 International Conference on Quality, Reliability, Risk, Maintenance, and Safety Engineering (QR2MSE) - Sensitive analysis of EMI effect in the μA741 operational amplifier circuit

Cheng, Jin-Li, Liu, Yuan, Liu, Jian-Bo, Wei, Ai-Xiang, Zhang, Ting, En, Yun-Fei, Lv, Jia-Jun

Рік:

2013

Мова:

english

Файл:

PDF, 1.37 MB

english, 2013

[IEEE 2013 20th IEEE International Symposium on the Physical and Failure Analysis of Integrated Circuits (IPFA) - Suzhou, China (2013.07.15-2013.07.19)] Proceedings of the 20th IEEE International Symposium on the Physical and Failure Analysis of Integrated Circuits (IPFA) - Bias dependence of dose rate effects in the irradiated substrate PNP transistors

Yuan Liu,, Qian Shi,, Ting Zhang,, Yun-Fei En,, Bin Li,, Yu-Juan He,

Рік:

2013

Файл:

PDF, 362 KB

2013

[IEEE 2013 20th IEEE International Symposium on the Physical and Failure Analysis of Integrated Circuits (IPFA) - Suzhou, China (2013.07.15-2013.07.19)] Proceedings of the 20th IEEE International Symposium on the Physical and Failure Analysis of Integrated Circuits (IPFA) - Research on tin whisker growth of pure tin plating of different lead substrates

Zhou Bin,, Wan Zhonghua,, Li Xunping,, En Yun-fei,

Рік:

2013

Мова:

english

Файл:

PDF, 961 KB

english, 2013

[IEEE 2009 16th IEEE International Symposium on the Physical and Failure Analysis of Integrated Circuits (IPFA) - Suzhou, Jiangsu, China (2009.07.6-2009.07.10)] 2009 16th IEEE International Symposium on the Physical and Failure Analysis of Integrated Circuits - Failure mechanism of Sn3.0Ag0.5Cu flip-chip solder joints under electric current stress

Lu, Yu-Dong, He, Xiao-Qi, En, Yun-Fei, Wang, Xin

Рік:

2009

Мова:

english

Файл:

PDF, 5.14 MB

english, 2009

Reliability Investigations of AlGaN/GaN HEMTs Based on On-State Electroluminescence Characterization

Zeng, Chang, Wang, Yuan-Sheng, Liao, Xue-Yang, Li, Ru-Guan, Chen, Yi-Qiang, Lai, Ping, Huang, Yun, En, Yun-Fei

Журнал:

IEEE Transactions on Device and Materials Reliability

Рік:

2015

Мова:

english

Файл:

PDF, 1.17 MB

english, 2015

Analysis of Indium–Zinc–Oxide Thin-Film Transistors Under Electrostatic Discharge Stress

Liu, Yuan, Chen, Rongsheng, Li, Bin, En, Yun-Fei, Chen, Yi-Qiang

Журнал:

IEEE Transactions on Electron Devices

Рік:

2018

Мова:

english

Файл:

PDF, 1.34 MB

english, 2018

Polarity effect of electromigration on intermetallic compound formation in SnPb solder joints

Yu-Dong Lu, Xiao-Qi He, Yun-Fei En, Xin Wang, Zhi-Qiang Zhuang

Журнал:

Acta Materialia

Рік:

2009

Мова:

english

Файл:

PDF, 695 KB

english, 2009

Clinical characteristics and molecular analysis of three Chinese children with Omenn syndrome

Zhi-Yong Zhang, Xiao-Dong Zhao, Li-Ping Jiang, En-Mei Liu, Yu-Xia Cui, Mo Wang, Hong Wei, Jie Yu, Yun-Fei An, Xi-Qiang Yang

Журнал:

Pediatric Allergy and Immunology

Рік:

2011

Мова:

english

Файл:

PDF, 260 KB

english, 2011

[IEEE 2013 IEEE International Conference of Electron Devices and Solid-State Circuits (EDSSC) - Hong Kong, Hong Kong (2013.06.3-2013.06.5)] 2013 IEEE International Conference of Electron Devices and Solid-state Circuits - Total dose induced bias current variation in the LM124 operational amplifier with Different Bias

Liu Jian-Bo,, Liu Yuan,, En Yun-Fei,, Yang Yuan-Zheng,, He Yu-Juan,, Shi Qian,

Рік:

2013

Мова:

english

Файл:

PDF, 531 KB

english, 2013

[IEEE 2009 8th International Conference on Reliability, Maintainability and Safety (ICRMS 2009) - Chengdu, China (2009.07.20-2009.07.24)] 2009 8th International Conference on Reliability, Maintainability and Safety - Failure modes of Sn3.0Ag0.5Cu flip-chip solder joints under current stress

Lu, Yu-Dong, He, Xiao-Qi, En, Yun-Fei, Wang, Xin

Рік:

2009

Мова:

english

Файл:

PDF, 1.63 MB

english, 2009

Total Dose Ionizing Radiation Effects in the Indium–Zinc Oxide Thin-Film Transistors

Liu, Yuan, Wu, Wei-Jing, En, Yun-Fei, Wang, Lei, Lei, Zhi-Feng, Wang, Xiao-Han

Журнал:

IEEE Electron Device Letters

Рік:

2014

Мова:

english

Файл:

PDF, 1.38 MB

english, 2014

Instability of Indium Zinc Oxide Thin-Film Transistors Under Transmission Line Pulsed Stress

Liu, Yuan, Wu, Wei-Jing, Lei, Zhi-Feng, Wang, Lei, Shi, Qian, Liu, Yu-Rong, En, Yun-Fei, Li, Bin

Журнал:

IEEE Electron Device Letters

Рік:

2014

Мова:

english

Файл:

PDF, 922 KB

english, 2014

[IEEE 2013 IEEE International Conference of Electron Devices and Solid-State Circuits (EDSSC) - Hong Kong, Hong Kong (2013.06.3-2013.06.5)] 2013 IEEE International Conference of Electron Devices and Solid-state Circuits - Ionizing radiation induced leakage current in the PD-SOI devices with different layout structures

Liu Yuan,, He Yu-Juan,, En Yun-Fei,, Shi Qian,

Рік:

2013

Мова:

english

Файл:

PDF, 631 KB

english, 2013

[IEEE 2012 13th International Conference on Electronic Packaging Technology & High Density Packaging (ICEPT-HDP) - Guilin, Guangxi, China (2012.08.13-2012.08.16)] 2012 13th International Conference on Electronic Packaging Technology & High Density Packaging - Reliability experiment of high power cm-bar arrays

Lu, Guo-guang, Lei, Zhi-feng, Huang, Yun, En, Yun-fei

Рік:

2012

Мова:

english

Файл:

PDF, 1.52 MB

english, 2012

[IEEE 2013 International Conference on Quality, Reliability, Risk, Maintenance, and Safety Engineering (QR2MSE) - Chengdu, China (2013.07.15-2013.07.18)] 2013 International Conference on Quality, Reliability, Risk, Maintenance, and Safety Engineering (QR2MSE) - Total dose irradiation effects in the μA741 operational amplifier with different biases

Liu, Jian-Bo, Liu, Yuan, Cheng, Jin-Li, En, Yun-Fei, Zhang, Ting, He, Yu-Juan, Dong, Fu-Yao

Рік:

2013

Мова:

english

Файл:

PDF, 1.44 MB

english, 2013

[IEEE 2013 International Conference on Quality, Reliability, Risk, Maintenance, and Safety Engineering (QR2MSE) - Chengdu, China (2013.07.15-2013.07.18)] 2013 International Conference on Quality, Reliability, Risk, Maintenance, and Safety Engineering (QR2MSE) - Measurement of ESD protection structure irradiation degradation using TLP method

Shi, Qian, Xiao, Qing-Zhong, Liu, Yuan, En, Yun-Fei

Рік:

2013

Мова:

english

Файл:

PDF, 1.52 MB

english, 2013

[IEEE 2011 International Conference on Electric Information and Control Engineering (ICEICE) - Wuhan, China (2011.04.15-2011.04.17)] 2011 International Conference on Electric Information and Control Engineering - Pre-designed Prognostic cells for host circuits reliability monitoring

Yu-Dong Lu,, Yun-Fei En,, Hong-Wei Luo,, Ming Wan,

Рік:

2011

Мова:

english

Файл:

PDF, 193 KB

english, 2011

[IEEE High Density Packaging (ICEPT-HDP) - Xi'an, China (2010.08.16-2010.08.19)] 2010 11th International Conference on Electronic Packaging Technology & High Density Packaging - Ductile-to-brittle transition of flip-chip solder joints influenced by electromigration

Lu, Yu-Dong, En, Yun-Fei, He, Xiao-Qi, Gang Niu,, Pecht, Michael, Xin Wang,

Рік:

2010

Мова:

english

Файл:

PDF, 961 KB

english, 2010

[IEEE 2012 13th International Conference on Electronic Packaging Technology & High Density Packaging (ICEPT-HDP) - Guilin, Guangxi, China (2012.08.13-2012.08.16)] 2012 13th International Conference on Electronic Packaging Technology & High Density Packaging - Loading rate and size effect on the fracture behavior of BGA structure Cu/Sn-3.0Ag-0.5Cu/Cu interconnects

Li, Xun-Ping, Qin, Hong-Bo, En, Yun-Fei, Xia, Jian-Min, Zhang, Xin-Ping

Рік:

2012

Мова:

english

Файл:

PDF, 1.49 MB

english, 2012

[IEEE 2013 International Conference on Quality, Reliability, Risk, Maintenance, and Safety Engineering (QR2MSE) - Chengdu, China (2013.07.15-2013.07.18)] 2013 International Conference on Quality, Reliability, Risk, Maintenance, and Safety Engineering (QR2MSE) - Experiment and numerical simulation of total dose effects in the substrate PNP transistors

Zhang, Ting, Liu, Yuan, En, Yun-Fei, He, Yu-Juan, Liu, Jian-Bo, Cheng, Jin-Li, Li, Bin

Рік:

2013

Мова:

english

Файл:

PDF, 1.38 MB

english, 2013

[IEEE 2013 International Conference on Quality, Reliability, Risk, Maintenance, and Safety Engineering (QR2MSE) - Chengdu, China (2013.07.15-2013.07.18)] 2013 International Conference on Quality, Reliability, Risk, Maintenance, and Safety Engineering (QR2MSE) - Modeling of reverse subthreshold currents in the A-Si:H TFTs

Liu, Yuan, En, Yun-Fei, He, Yu-Juan, Shi, Qian

Рік:

2013

Мова:

english

Файл:

PDF, 1.41 MB

english, 2013

[IEEE 2013 IEEE International Conference of Electron Devices and Solid-State Circuits (EDSSC) - Hong Kong, Hong Kong (2013.06.3-2013.06.5)] 2013 IEEE International Conference of Electron Devices and Solid-state Circuits - Effect of bias dependence of substrate NPN transistor on total dose irradiation

Ting Zhang,, Yuan Liu,, Bin Li,, Yun-Fei En,, Yu-Juan He,

Рік:

2013

Мова:

english

Файл:

PDF, 342 KB

english, 2013

[IEEE 2012 13th International Conference on Electronic Packaging Technology & High Density Packaging (ICEPT-HDP) - Guilin, Guangxi, China (2012.08.13-2012.08.16)] 2012 13th International Conference on Electronic Packaging Technology & High Density Packaging - Study on interfacial behavior and shear strength of lead-free micro-interconnect bump after SnPb reballing

Zhou, Bin, Zhou, Qing, En, Yun-fei

Рік:

2012

Мова:

english

Файл:

PDF, 664 KB

english, 2012

[IEEE 2013 14th International Conference on Electronic Packaging Technology (ICEPT) - Dalian, China (2013.08.11-2013.08.14)] 2013 14th International Conference on Electronic Packaging Technology - Construction analysis for inherent reliability evaluation of surface acoustic wave filters

Liu, Hong-Zhi, Liu, Xin, En, Yun-Fei, Huang, Yun, Lai, Ping

Рік:

2013

Мова:

english

Файл:

PDF, 1.07 MB

english, 2013

Improvement of total-dose irradiation hardness of silicon-on-insulator materials by modifying the buried oxide layer with ion implantation

En-Xia, Zhang, Cong, Qian, Zheng-Xuan, Zhang, Cheng-Lu, Lin, Xi, Wang, Ying-Min, Wang, Xiao-He, Wang, Gui-Ru, Zhao, Yun-Fei, En, Hong-Wei, Luo, Qian, Shi

Журнал:

Chinese Physics

Рік:

2006

Мова:

english

Файл:

PDF, 290 KB

english, 2006

Numerical investigation of the effects of polypropylene hollow fibre membrane structure on the performance of CO 2 removal from flue gas

Zhang, Li, Qu, Zi-Yi, Yan, Yun-Fei, Ju, Shun-Xiang, Zhang, Zhi-En

Журнал:

RSC Advances

Рік:

2015

Мова:

english

Файл:

PDF, 870 KB

english, 2015

Utilizing a shallow trench isolation parasitic transistor to characterize the total ionizing dose effect of partially-depleted silicon-on-insulator input/output n-MOSFETs

Peng, Chao, Hu, Zhi-Yuan, Ning, Bing-Xu, Huang, Hui-Xiang, Fan, Shuang, Zhang, Zheng-Xuan, Bi, Da-Wei, En, Yun-Fei

Журнал:

Chinese Physics B

Рік:

2014

Мова:

english

Файл:

PDF, 531 KB

english, 2014

Interface states in Al 2 O 3 /AlGaN/GaN metal-oxide-semiconductor structure by frequency dependent conductance technique

Liao, Xue-Yang, Zhang, Kai, Zeng, Chang, Zheng, Xue-Feng, En, Yun-Fei, Lai, Ping, Hao, Yue

Журнал:

Chinese Physics B

Рік:

2014

Мова:

english

Файл:

PDF, 1.13 MB

english, 2014

An interconnecting bus power optimization method combining interconnect wire spacing with wire ordering

Zhu, Zhang-Ming, Hao, Bao-Tian, En, Yun-Fei, Yang, Yin-Tang, Li, Yue-Jin

Журнал:

Chinese Physics B

Рік:

2011

Мова:

english

Файл:

PDF, 1010 KB

english, 2011

An Interconnect Bus Power Optimization Method

Yun-Fei, En, Zhang-Ming, Zhu, Yue, Hao

Журнал:

Chinese Physics Letters

Рік:

2010

Мова:

english

Файл:

PDF, 1.16 MB

english, 2010

A statistical RCL interconnect delay model taking account of process variations

Zhu, Zhang-Ming, Wan, Da-Jing, Yang, Yin-Tang, En, Yun-Fei

Журнал:

Chinese Physics B

Рік:

2011

Мова:

english

Файл:

PDF, 1.06 MB

english, 2011

Temperature-Dependent Drain Current Characteristics and Low Frequency Noises in Indium Zinc Oxide Thin Film Transistors

Liu, Yuan, Wu, Wei-Jing, Qiang, Lei, Wang, Lei, En, Yun-Fei, Li, Bin

Журнал:

Chinese Physics Letters

Рік:

2015

Мова:

english

Файл:

PDF, 888 KB

english, 2015

SPIE Proceedings [SPIE International Conference on Optical Instruments and Technology (OIT2013) - Beijing, China (Sunday 17 November 2013)] 2013 International Conference on Optical Instruments and Technology: Optoelectronic Devices and Optical Signal Processing - Thermal effect of diode-pumped solid state lasers based on composite crystals

Dong, Yi, Bao, Xiaoyi, Lu, Chao, Xin, Xiangjun, Yam, Scott S., Zhang, Xuping, Hao, Ming-ming, Lu, Guo-guang, Zhu, Hong-bo, Huang, Yun, En, Yun-fei

Рік:

2013

Мова:

english

Файл:

PDF, 408 KB

english, 2013

Possible involvement of l-arginine–nitric oxide (NO)-cyclic guanosine monophosphate (cGMP) signaling pathway in the antidepressant-like effect of Wuling mycelia powder in rat

Tan, Yun-fei, Liao, Zheng-luan, Qiu, Ya-ju, Zhu, Jun-peng, Yu, En-yan

Журнал:

Biomedicine & Pharmacotherapy

Рік:

2016

Мова:

english

Файл:

PDF, 1.02 MB

english, 2016

Low frequency noise and radiation response in the partially depleted SOI MOSFETs with ion implanted buried oxide

Liu, Yuan, Chen, Hai-Bo, Liu, Yu-Rong, Wang, Xin, En, Yun-Fei, Li, Bin, Lu, Yu-Dong

Журнал:

Chinese Physics B

Рік:

2015

Мова:

english

Файл:

PDF, 515 KB

english, 2015

Kinetics based on the base-catalyzed mechanism of a click reaction between glycol dimercaptoacetate and glycidyl phenyl ether

Yao, Zhen, Dai, Bo-en, Yu, Yun-fei, Ji, Hai-wei, Zhou, Li-zhong, Cao, Kun

Журнал:

RSC Advances

Рік:

2017

Мова:

english

Файл:

PDF, 696 KB

english, 2017

Comparative study of mobility extraction methods in p -type polycrystalline silicon thin film transistors

Liu, Kai, Liu, Yuan, Liu, Yu-Rong, En, Yun-Fei, Li, Bin

Журнал:

Modern Physics Letters B

Рік:

2017

Мова:

english

Файл:

PDF, 735 KB

english, 2017

Analysis of low frequency noise characteristics in p -type polycrystalline silicon thin film transistors

Liu, Yuan, En, Yun-Fei, Fang, Wen-Xiao

Журнал:

Modern Physics Letters B

Рік:

2017

Мова:

english

Файл:

PDF, 831 KB

english, 2017

Total Ionizing Dose Radiation Effects in the P-Type Polycrystalline Silicon Thin Film Transistors

Liu, Yuan, Liu, Kai, Chen, Rong-Sheng, Liu, Yu-Rong, En, Yun-Fei, Li, Bin, Fang, Wen-Xiao

Журнал:

Chinese Physics Letters

Рік:

2017

Мова:

english

Файл:

PDF, 578 KB

english, 2017

Influence of Total Ionizing Dose Irradiation on Low-Frequency Noise Responses in Partially Depleted SOI nMOSFETs

Peng, Chao, En, Yun-Fei, Lei, Zhi-Feng, Chen, Yi-Qiang, Liu, Yuan, Li, Bin

Журнал:

Chinese Physics Letters

Рік:

2017

Мова:

english

Файл:

PDF, 1.59 MB

english, 2017

Analysis and Simulation of Low-Frequency Noise in Indium-Zinc-Oxide Thin-Film Transistors

Liu, Yuan, He, Hongyu, Chen, Rongsheng, En, Yun-Fei, Li, Bin, Chen, Yi-Qiang

Журнал:

IEEE Journal of the Electron Devices Society

Рік:

2018

Мова:

english

Файл:

PDF, 1.43 MB

english, 2018

[IEEE 2016 13th IEEE International Conference on Solid-State and Integrated Circuit Technology (ICSICT) - Hangzhou, China (2016.10.25-2016.10.28)] 2016 13th IEEE International Conference on Solid-State and Integrated Circuit Technology (ICSICT) - The analysis of ESD degradation in p-type poly-Si thin film transistor

Kai Liu,, Yuan Liu,, Yu-Rong Liu,, Rong-Sheng Chen,, Yun-Fei En,

Рік:

2016

Мова:

english

Файл:

PDF, 6.11 MB

english, 2016

Low-Frequency Noise in Hybrid-Phase- Microstructure ITO-Stabilized ZnO Thin-Film Transistors

Liu, Yuan, Deng, Sunbin, Chen, Rongsheng, Li, Bin, En, Yun-Fei, Chen, Yiqiang

Журнал:

IEEE Electron Device Letters

Рік:

2018

Мова:

english

Файл:

PDF, 1004 KB

english, 2018

Degradation of current–voltage and low frequency noise characteristics under negative bias illumination stress in InZnO thin film transistors

Wang, Li, Liu, Yuan, Geng, Kui-Wei, Chen, Ya-Yi, En, Yun-Fei

Журнал:

Chinese Physics B

Рік:

2018

Мова:

english

Файл:

PDF, 1.12 MB

english, 2018

Mechanisms of atmospheric neutron-induced single event upsets in nanometric SOI and bulk SRAM devices based on experiment-verified simulation tool

Lei, Zhi-Feng, Zhang, Zhan-Gang, En, Yun-Fei, Huang, Yun

Журнал:

Chinese Physics B

Рік:

2018

Мова:

english

Файл:

PDF, 1.18 MB

english, 2018

Low-Frequency Noise in Amorphous Indium Zinc Oxide Thin Film Transistors with Aluminum Oxide Gate Insulator

Chen, Ya-Yi, Liu, Yuan, Wu, Zhao-Hui, Wang, Li, Li, Bin, En, Yun-Fei, Chen, Yi-Qiang

Журнал:

Chinese Physics Letters

Рік:

2018

Мова:

english

Файл:

PDF, 846 KB

english, 2018

Investigation of maximum proton energy for qualified ground-based evaluation of single-event effects in SRAM devices

Zhang, Zhan-Gang, Huang, Yun, En, Yun-Fei, Lei, Zhi-Feng

Журнал:

Nuclear Science and Techniques

Рік:

2019

Файл:

PDF, 1.96 MB

2019